Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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GB/T 35099-2018 Microbeam analysis—Scanning electron microscopy with energy dispersive X-ray spectrometry—Morphology and element analysis of single fine particles in ambient air $250.00 via email in 1~3 business day valid
GB/T 35158-2017 Verification method for Auger electron spectrometers $810.00 via email in 1~5 business day valid
GB/T 35924-2018 Determination of moisture in solid chemical products—Thermogravimetry method $80.00 via email in 1~3 business day valid
GB/T 35930-2018 Determination of vapor pressure of chemical products—Thermogravimetry method $80.00 via email in 1~3 business day valid
GB/T 36052-2018 Surface chemical analysis—Data transfer format for scanning probe microscopy $490.00 via email in 1~5 business day valid
GB/T 36053-2018 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry—Instrumental requirements, alignment and positioning, data collection, data analysis and reporting $430.00 via email in 1~5 business day valid
GB/T 36065-2018 Nanotechnologies—Analysis of amorphous carbon, ash and volatile of carbon nanotubes—Thermogravimetry $280.00 via email in 1~3 business day valid
GB/T 36401-2018 Surface chemical analysis—X-ray photoelectron spectroscopy—Reporting of results of thin-film analysis $610.00 via email in 1~5 business day valid
GB/T 36504-2018 Guide for the analysis of the printed circuit board surface contamination—Auger electron spectroscopy $160.00 via email in 1~3 business day valid
GB/T 36533-2018 Determination of the chemical state of micro-iron in silicate—Auger electron spectroscopy $220.00 via email in 1~3 business day valid
GB/T 3723-1999 Sampling of chemical products for industrial use--Safety in sampling $120.00 immediately valid
GB/T 40109-2021 Surface chemical analysis - Secondary-ion mass spectrometry - Method for depth profiling of boron in silicon $250.00 via email in 1~3 business day valid
GB/T 40110-2021 Surface chemical analysis - Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy $450.00 via email in 1~5 business day valid
GB/T 40128-2021 Surface chemical analysis—Atomic force microscopy—Test method for thickness of the two-dimensional layered molybdenum disulfide nanosheets $315.00 via email in 1~5 business day valid
GB/T 40129-2021 Surface chemical analysis—Secondary ion mass spectrometry—Calibration of the mass scale for a time-of-flight secondary ion mass spectrometer $255.00 via email in 1~3 business day valid
GB/T 40244-2021 Chemicals - Liquid or solid identification - Fluidity test method $100.00 via email in 1~3 business day valid
GB/T 40300-2021 Microbeam analysis—Analytical electron microscopy—Vocabulary $495.00 via email in 1~5 business day valid
GB/T 41064-2021 Surface chemical analysis—Depth profiling—Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films $270.00 via email in 1~3 business day valid
GB/T 41072-2021 Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis $315.00 via email in 1~5 business day valid
GB/T 41073-2021 Surface chemical analysis―Electron spectroscopies―Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy $315.00 via email in 1~5 business day valid
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