Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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YS/T 1061-2015 Silicon core for polysilicon by improved siemens method 105.0 via email in 1~3 business day valid
GB/T 6617-2009 Test method for measuring resistivity of silicon wafer using spreading resistance probe 150.0 via email in 1~3 business day valid
GB/T 24580-2009 Test method for measuring Boron contamination in heavily doped n-type silicon substrates by secondary ion mass spectrometry 180.0 via email in 1~3 business day valid
GB/T 12963-2014 Electronic-grade polycrystalline silicon 90.0 via email in 1~3 business day valid
YS/T 985-2014 Polished reclaimed silicon wafers 225.0 via email in 1~3 business day valid
GB/T 25074-2017 Solar-grade polycrystalline silicon 120.0 via email in 1~3 business day valid
GB/T 32573-2016 Silicon powder―Determination of total carbon content―Infrared absorption method after combustion in an induction furnace 150.0 via email in 1~3 business day valid
GB/T 20230-2006 Indium phosphide single crystal 90.0 via email in 1~3 business day valid
GB/T 24581-2009 Test method for low temperature FT-IR analysis of single crystal silicon for Ⅲ-Ⅴ impurities 170.0 via email in 1~3 business day valid
GB/T 26069-2010 Specification for silicon annealed wafers 180.0 via email in 1~3 business day valid
YS/T 43-1992 45.0 via email in 1~3 business day abolished
GB/T 12965-2018 Monocrystalline silicon as cut wafers and lapped wafers 165.0 via email in 1~3 business day valid
GB/T 30656-2014 Polished monocrystalline silicon carbide wafers 210.0 via email in 1~3 business day valid
GB/T 2881-2014 Silicon metal 140.0 via email in 1~3 business day valid
GB/T 35305-2017 Monocrystalline gallium arsenide polished wafers for solar cell 165.0 via email in 1~3 business day valid
GB/T 12965-1996 Monocrystalline silicon as cut slices and lapped slices 105.0 via email in 1~3 business day abolished
GB/T 12962-2015 Monocrystalline silicon 150.0 via email in 1~3 business day valid
GB/T 25076-2018 Monocrystalline silicon for solar cell 159.0 via email in 1~3 business day valid
YS 68-2004 Arsenic 60.0 via email in 1~3 business day abolished
GB/T 14140-2009 Test method for measuring diameter of semiconductor wafer 180.0 via email in 1~3 business day valid
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