This standard specifies general electrical test methods of semiconductor converters.
This standard is applicable to all kinds of common converters, including rectifier, inverter, converter in both rectifying and inverting operating modes and electronic power switches. It is also used as a reference for special converters.
This standard is not applicable to converters for motor vehicle and on-board converter for aviation appliance.
2 Normative References
The following documents for the application of this document are essential. For dated reference, only the edition cited applies. For undated references, the latest edition of the normative document (including any amendments) applies.
GB/T 2900.33-2004 Electrotechnical Terminology - Power Electronics (IEC 60050-551: 1998 and IEC 60050-551-20: 2001, IDT)
GB/T 3859.1-2013 Semiconductor Converters-General Requirements and Line Commutated Converters - Part 1-1: Specification of Basic Requirements (IEC 60146-1-1: 2009, MOD)
GB/T 3859.2-2013 Semiconductor Converters-General Requirements and Line Commutated Converters - Part 1-2: Application Guide (IEC/TR 60146-1-2: 2011, MOD)
GB/T 3859.4-2004 Semiconductor Converter - Self-commutated Semiconductor Converters Including Direct d.c. Converters (IEC 60146-2: 1999, IDT)
GB/T 17626.2-2006 Electromagnetic Compatibility-Testing and Measurement Techniques-Electrostatic Discharge Immunity Test (IEC 61000-4-2: 2001, IDT)
GB/T 17626.4-2008 Electromagnetic Compatibility-Testing and Measurement Techniques Electrical Fast Transient/Burst Immunity Test (IEC 61000-4-4: 2004, IDT)
GB/T 17626.5-2008 Electromagnetic Compatibility - Testing and Measurement Techniques - Surge (Impact) Immunity Test (IEC 61000-4-5: 2005, IDT)
GB/T 17626.12-1998 Electromagnetic Compatibility - Testing and Measurement Techniques - Oscillatory Waves Immunity Test (idt IEC 61000-4-12: 1995)
GB 17799.4-2001 Electromagnetic Compatibility - Generic Standards - Emission Standard for Industrial Environments (idt IEC 61000-6-4: 1997)
3 Terms and Definitions
For the purposes of this document, the terms and definitions established in GB/T 2900.33, GB/T 3859.1, GB/T 3859.2 and GB/T 3859.4 and the following ones apply. For convenient use, some terms and definitions established in GB/T 2900.33, GB/T 3859.1 and GB/T 3859.4 are listed in this standard.
3.1
d.c. ripple factor
Half of the difference of pulse DC electric quantity peak from the valley divided by the average DC electric quantity.
[GB/T 2900.33-2004, 551-17-29]
Foreword I 1 Scope 2 Normative References 3 Terms and Definitions 4 General Test Requirements 4.1 General 4.2 General test requirements 5 Test Methods 5.1 General electrical test 5.3 Electrical Test of A.C. Circuit Appendix A (Normative) Determination of the Wasted Power Appendix B (Informative) Several Typical Test Circuits Appendix C (Informative) Pulsating D.C. Ripple as Well as Transient Voltage Waveform During Load Increased and Decreased Suddenly
1 Scope
This standard specifies general electrical test methods of semiconductor converters.
This standard is applicable to all kinds of common converters, including rectifier, inverter, converter in both rectifying and inverting operating modes and electronic power switches. It is also used as a reference for special converters.
This standard is not applicable to converters for motor vehicle and on-board converter for aviation appliance.
2 Normative References
The following documents for the application of this document are essential. For dated reference, only the edition cited applies. For undated references, the latest edition of the normative document (including any amendments) applies.
GB/T 2900.33-2004 Electrotechnical Terminology - Power Electronics (IEC 60050-551: 1998 and IEC 60050-551-20: 2001, IDT)
GB/T 3859.1-2013 Semiconductor Converters-General Requirements and Line Commutated Converters - Part 1-1: Specification of Basic Requirements (IEC 60146-1-1: 2009, MOD)
GB/T 3859.2-2013 Semiconductor Converters-General Requirements and Line Commutated Converters - Part 1-2: Application Guide (IEC/TR 60146-1-2: 2011, MOD)
GB/T 3859.4-2004 Semiconductor Converter - Self-commutated Semiconductor Converters Including Direct d.c. Converters (IEC 60146-2: 1999, IDT)
GB/T 17626.2-2006 Electromagnetic Compatibility-Testing and Measurement Techniques-Electrostatic Discharge Immunity Test (IEC 61000-4-2: 2001, IDT)
GB/T 17626.4-2008 Electromagnetic Compatibility-Testing and Measurement Techniques Electrical Fast Transient/Burst Immunity Test (IEC 61000-4-4: 2004, IDT)
GB/T 17626.5-2008 Electromagnetic Compatibility - Testing and Measurement Techniques - Surge (Impact) Immunity Test (IEC 61000-4-5: 2005, IDT)
GB/T 17626.12-1998 Electromagnetic Compatibility - Testing and Measurement Techniques - Oscillatory Waves Immunity Test (idt IEC 61000-4-12: 1995)
GB 17799.4-2001 Electromagnetic Compatibility - Generic Standards - Emission Standard for Industrial Environments (idt IEC 61000-6-4: 1997)
3 Terms and Definitions
For the purposes of this document, the terms and definitions established in GB/T 2900.33, GB/T 3859.1, GB/T 3859.2 and GB/T 3859.4 and the following ones apply. For convenient use, some terms and definitions established in GB/T 2900.33, GB/T 3859.1 and GB/T 3859.4 are listed in this standard.
3.1
d.c. ripple factor
Half of the difference of pulse DC electric quantity peak from the valley divided by the average DC electric quantity.
[GB/T 2900.33-2004, 551-17-29]
Contents of GB/T 13422-2013
Foreword I
1 Scope
2 Normative References
3 Terms and Definitions
4 General Test Requirements
4.1 General
4.2 General test requirements
5 Test Methods
5.1 General electrical test
5.3 Electrical Test of A.C. Circuit
Appendix A (Normative) Determination of the Wasted Power
Appendix B (Informative) Several Typical Test Circuits
Appendix C (Informative) Pulsating D.C. Ripple as Well as Transient Voltage Waveform During Load Increased and Decreased Suddenly
