 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
| Position: Chinese Standard in English/GB/T 14140.1-1993 |
| GB/T 14140.1-1993 Silicon slices and wafers--Measuring of diameter--Optical projecting method (English Version) | |||
| Standard No.: | GB/T 14140.1-1993 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 6000 words | Translation Price(USD): | 180.0 remind me the price change |
| Implemented on: | 1993-10-1 | Delivery: | via email in 1~3 business day |
| → | → | → |
| Standard No.: | GB/T 14140.1-1993 |
| English Name: | Silicon slices and wafers--Measuring of diameter--Optical projecting method |
| Chinese Name: | 硅片直径测量方法 光学投影法 |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | SBTS |
| Issued on: | 1992-02-06 |
| Implemented on: | 1993-10-1 |
| Status: | superseded |
| Superseded by: | GB/T 14140-2009 Test method for measuring diameter of semiconductor wafer |
| Superseded on: | 2010-6-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 6000 words |
| Translation Price(USD): | 180.0 |
| Delivery: | via email in 1~3 business day |