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GB/T 14145-1993   Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy (English Version)
Standard No.: GB/T 14145-1993 Status:abolished remind me the status change
Language:English File Format:PDF
Word Count: 2000 words Price(USD):180.0 remind me the price change
Implemented on:1993-10-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 14145-1993
English Name: Test method for stacking fault density of epitaxial layers of silicon by interference contrast microscopy
Chinese Name: 硅外延层堆垛层错密度测定干涉相衬显微镜法
Chinese Classification: H24    Metallographic testing method
Professional Classification: GB    National Standard
Issued by: SBTS
Issued on: 1993-02-06
Implemented on: 1993-10-1
Status: abolished
Abolished on:2005-10-14
Language: English
File Format: PDF
Word Count: 2000 words
Price(USD): 180.0
Delivery: via email in 1~3 business day
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