Standard No.:	GB/T 14849.5-2014
English Name:	Methods for chemical analysis of silicon metal―Part 5:Determination of impurity contents―X-ray fluorescence method
Chinese Name:	工业硅化学分析方法 第5部分：杂质元素含量的测定 X射线荧光光谱法
Chinese Classification:	H12    Light metals and their alloys analysis method
Professional Classification:	GB    National Standard
ICS Classification:	77.120.10 77.120.10    Aluminium and aluminium alloys 77.120.10
Source Content Issued by:	AQSIQ; SAC
Issued on:	2014-12-05
Implemented on:	2015-5-1
Status:	valid
Superseding:	GB/T 14849.5-2010 Chemical analysis of slion metal—Part 5:Determination of elements content—Analysis using an X-ray fluorescence method
Target Language:	English
File Format:	PDF
Word Count:	5500 words
Translation Price(USD):	160.0
Delivery:	via email in 1~3 business day

GB/T14849的本部分规定了工业硅中铁、铝、钙、锰、镍、钛、铜、磷、镁、铬、钒、钴含量的测定方法。
本部分适用于工业硅中铁、铝、钙、锰、镍、钛、铜、磷、镁、铬、钒、钴含量的测定,测定范围见表1。表 1
元素 质量分数/% 元素 质量分数/%
铁 0.020~1.500 铜 0.001~0.050
铝 0.050~1.000 磷 0.001~0.050
钙 0.010~1.000 镁 0.001~0.050
锰 0.0050~0.1000 铬 0.001~0.050
镍 0.0010~0.1000 钒 0.0005~0.0500
钛 0.0050~0.1000 钴 0.0005~0.0500