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| Position: Chinese Standard in English/GB/T 1552-1995 |
| GB/T 1552-1995 Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array (English Version) | |||
| Standard No.: | GB/T 1552-1995 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 8000 words | Price(USD): | 240.00 remind me the price change |
| Implemented on: | 1995-1-2 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 1552-1995 |
| English Name: | Test method for measuring resistivity of monocrystal silicon and germanium with a collinear four-probe array |
| Chinese Name: | 硅、锗单晶电阻率测定直排四探针法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.30 Chemical analysis of metals |
| Issued by: | STSB |
| Issued on: | 1995-04-18 |
| Implemented on: | 1995-1-2 |
| Status: | superseded |
| Superseded by: | GB/T 1551-2009 Test method for measuring resistivity of monocrystal silicon |
| Superseded on: | 2010-6-1 |
| Superseding: | GB 1552-1979 Measurement of resistivity for monocrystalline silicon with D-C four point probe GB 5251-1985 Germanium monocrystal--Examination of resistivity--DC linear four-point probe GB 6615-1986 Standard method for resistivity of silicon slices with collinear four-probe array measuring |
| Language: | English |
| File Format: | |
| Word Count: | 8000 words |
| Price(USD): | 240.00 |
| Delivery: | via email in 1~3 business day |