Standard No.:	GB/T 17473.5-2008
English Name:	Test methods of pastes used for microelectronics - Determination of viscosity
Chinese Name:	微电子技术用贵金属浆料测试方法 粘度测定
Chinese Classification:	H68    Precious metals and their alloys
Professional Classification:	GB    National Standard
ICS Classification:	77.120.99 77.120.99    Other non-ferrous metals and their alloys 77.120.99
Source Content Issued by:	AQSIQ; SAC
Issued on:	2008-3-31
Implemented on:	2008-9-1
Status:	to be superseded
Superseded by:	GB/T 17473-2025 Performance test method for electronic pastes— Conductor pastes test
Superseded on:	2026-5-1
Abolished on:	2026-05-01
Superseding:	GB/T 17473.5-1998 Test methods of precious metal pastes used for thick film microelectronics--Determination of viscosity
Target Language:	English
File Format:	PDF
Word Count:	4000 words
Translation Price(USD):	90.0
Delivery:	via email in 1~3 business day

本标准是对ＧＢ／Ｔ１７４７３—１９９８《厚膜微电子技术用贵金属浆料测试方法》（所有部分）的整合修订，分为７个部分,本部分为ＧＢ／Ｔ１７４７３—２００８的第５部分。 本标准规定了微电子技术用贵金属浆料中 粘度的测定方法。 本部分代替ＧＢ／Ｔ１７４７３．５—１９９８《厚膜微电子技术用贵金属浆料测试方法　粘度测定》。
本部分与ＧＢ／Ｔ１７４７３．５—１９９８相比，主要有如下变化：
———将原标准名称修改为：微电子技术用贵金属浆料测试方法　粘度测定；
———将原标准中范围去除“非贵金属电子浆料粘度测定也可参照本标准执行”