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| Position: Chinese Standard in English/GB/T 30701-2014 |
| GB/T 30701-2014 Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy (English Version) | |||
| Standard No.: | GB/T 30701-2014 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 10500 words | Price(USD): | 310.00 remind me the price change |
| Implemented on: | 2014-12-1 | Delivery: | via email in 1~5 business day |
| Standard No.: | GB/T 30701-2014 |
| English Name: | Surface chemical analysis―Chemical methods for the collection of elements from the surface of silicon-wafer working reference materials and their determination by total-reflection X-ray fluorescence(TXRF) spectroscopy |
| Chinese Name: | 表面化学分析 硅片工作标准样品表面元素的化学收集方法和全反射X射线荧光光谱法(TXRF)测定 |
| Chinese Classification: | G04 Basic standards and general methods |
| Professional Classification: | GB National Standard |
| ICS Classification: | 71.040.40 Chemical analysis |
| Issued by: | AQSIQ; SAC |
| Issued on: | 2014-06-09 |
| Implemented on: | 2014-12-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 10500 words |
| Price(USD): | 310.00 |
| Delivery: | via email in 1~5 business day |