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| Position: Chinese Standard in English/GB/T 32495-2016 |
| GB/T 32495-2016 Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon (English Version) | |||
| Standard No.: | GB/T 32495-2016 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 7000 words | Price(USD): | 190.00 remind me the price change |
| Implemented on: | 2017-1-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 32495-2016 |
| English Name: | Surface chemical analysis—Secondary-ion mass spectrometry—Method for depth profiling of arsenic in silicon |
| Chinese Name: | 表面化学分析 二次离子质谱 硅中砷的深度剖析方法 |
| Chinese Classification: | G04 Basic standards and general methods |
| Professional Classification: | GB National Standard |
| ICS Classification: | 71.040.40 Chemical analysis |
| Issued by: | AQSIQ; MOH |
| Issued on: | 2016-02-24 |
| Implemented on: | 2017-1-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 7000 words |
| Price(USD): | 190.00 |
| Delivery: | via email in 1~3 business day |