Standard No.:	GB/T 34002-2017
English Name:	Microbeam analysis―Analytical transmission electron microscopy―Methods for calibrating image magnification by using reference materials having periodic structures
Chinese Name:	微束分析 透射电子显微术 用周期结构标准物质校准图像放大倍率的方法
Chinese Classification:	G04    Basic standards and general methods
Professional Classification:	GB    National Standard
ICS Classification:	71.040.40 71.040.40    Chemical analysis 71.040.40
Issued by:	MOHURD; AQSIQ
Issued on:	2017-07-12
Implemented on:	2018-6-1
Status:	valid
Language:	English
File Format:	PDF
Word Count:	18500 words
Price(USD):	550.00
Delivery:	via email in 1~5 business day

本标准规定了透射电镜（TEM）在很大放大倍率范围内所记录的图像的校准方法。用于校准的标准物质具有周期性结构，例如衍射光栅复型、半导体的超点阵结构或 X 射线分析的分光晶体以及碳、金或硅的晶体晶格像。 本标准适用于记录在照相胶片上、或成像板上、或数字相机内置传感