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Position: Chinese Standard in English/GB/T 6624-1995
GB/T 6624-1995   Standard method for measuring the surface quality of polished silicon slices by visual inspection (English Version)
Standard No.: GB/T 6624-1995 Status:superseded
Language:English File Format:PDF
Word Count: 2000 words Price(USD):180.00 remind me the price change
Implemented on:1995-1-2 Delivery: via email in 1~3 business day
Standard No.: GB/T 6624-1995
English Name: Standard method for measuring the surface quality of polished silicon slices by visual inspection
Chinese Name: 硅抛光片表面质量目测检验方法
Chinese Classification: H21    Metal physical property test method
Professional Classification: GB    National Standard
Issued by: SBTS
Issued on: 1995-04-18
Implemented on: 1995-1-2
Status: superseded
Superseded by:GB/T 6624-2009 Standard method for measuring the surface quality of polished silicon slices by visual inspection
Superseded on:2010-6-1
Language: English
File Format: PDF
Word Count: 2000 words
Price(USD): 180.00
Delivery: via email in 1~3 business day
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