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| Position: Chinese Standard in English/JB/T 8268-1999 |
| JB/T 8268-1999 Standard test method for surface defect of photoconductor for electrostatic process (English Version) | |||
| Standard No.: | JB/T 8268-1999 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 2000 words | Translation Price(USD): | 184.0 remind me the price change |
| Implemented on: | 2000-1-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | JB/T 8268-1999 |
| English Name: | Standard test method for surface defect of photoconductor for electrostatic process |
| Chinese Name: | 静电复印感光体表面缺陷 测量方法 |
| Chinese Classification: | N47 Micro and copier machinery |
| Professional Classification: | JB Professional Standard - Machinery |
| Source Content Issued by: | State Bureau of Machine Building Industry |
| Issued on: | 1999-8-6 |
| Implemented on: | 2000-1-1 |
| Status: | superseded |
| Superseded by: | JB/T 8268-2015 Standard test method for surface defect of photoconductor for electrostatic process |
| Superseded on: | 2015-10-1 |
| Superseding: | JB 8268-1995 |
| Target Language: | English |
| File Format: | |
| Word Count: | 2000 words |
| Translation Price(USD): | 184.0 |
| Delivery: | via email in 1~3 business day |