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| Position: Chinese Standard in English/QJ 2689-1994 |
| QJ 2689-1994 X-Radiographic Examination Test for Remainder in Electronic Devices (English Version) | |||
| Standard No.: | QJ 2689-1994 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 4000 words | Price(USD): | 120.00 remind me the price change |
| Implemented on: | 1994-12-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | QJ 2689-1994 |
| English Name: | X-Radiographic Examination Test for Remainder in Electronic Devices |
| Chinese Name: | 电子器件中多余物的X射线照相检验方法 |
| Chinese Classification: | L10 Electronic element in general |
| Professional Classification: | QJ Professional Standard - Aerospace |
| Issued on: | 1994-06-24 |
| Implemented on: | 1994-12-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 4000 words |
| Price(USD): | 120.00 |
| Delivery: | via email in 1~3 business day |