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Position: Chinese Standard in English/SJ 20233-1993 |
SJ 20233-1993 Verification regulation of model IMPACT-II semiconductor discrete device test sysytem (English Version) | |||
Standard No.: | SJ 20233-1993 | Status: | valid remind me the status change |
Language: | English | File Format: | |
Word Count: | 13000 words | Price(USD): | 390.00 remind me the price change |
Implemented on: | 1993-5-1 | Delivery: | via email in 1~5 business day |
Standard No.: | SJ 20233-1993 |
English Name: | Verification regulation of model IMPACT-II semiconductor discrete device test sysytem |
Chinese Name: | IMPACT-Ⅱ型半导体分立器件测试系统检定规程 |
Chinese Classification: | L0150 |
Professional Classification: | SJ Professional Standard - Electronics |
Issued on: | 1993-02-09 |
Implemented on: | 1993-5-1 |
Status: | valid |
Language: | English |
File Format: | |
Word Count: | 13000 words |
Price(USD): | 390.00 |
Delivery: | via email in 1~5 business day |
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Keywords: | ||
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