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SJ 20789-2000   Rapid screening test methods for Thermal sensitive parameter of MOS field effect transistor (English Version)
Standard No.: SJ 20789-2000 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 2500 words Price(USD):75.0 remind me the price change
Implemented on:2000-10-20 Delivery: via email in 1~3 business day
Standard No.: SJ 20789-2000
English Name: Rapid screening test methods for Thermal sensitive parameter of MOS field effect transistor
Chinese Name: MOS场效应晶体管热敏参数快速筛选试验方法
Chinese Classification: L5961    
Professional Classification: SJ    Professional Standard - Electronics
Issued by: Ministry of Information Industry
Issued on: 2000-10-20
Implemented on: 2000-10-20
Status: valid
Language: English
File Format: PDF
Word Count: 2500 words
Price(USD): 75.0
Delivery: via email in 1~3 business day
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