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SJ 2658.1-1986   Methods of Measurement for Semiconductor Infrared Diodes - General Rules (English Version)
Standard No.: SJ 2658.1-1986 Status:superseded remind me the status change
Language:English File Format:PDF
Word Count: 1000 words Price(USD):30.0 remind me the price change
Implemented on:1986-10-1 Delivery: via email in 1~3 business day
Standard No.: SJ 2658.1-1986
English Name: Methods of Measurement for Semiconductor Infrared Diodes - General Rules
Chinese Name: 半导体红外发光二极管测试方法 总则
Chinese Classification: L53    Semiconductor emitting device
Professional Classification: SJ    Professional Standard - Electronics
Implemented on: 1986-10-1
Status: superseded
Superseded by:SJ/T 2658.1-2015
Superseded on:2016-4-1
Abolished on:2016-04-01
Language: English
File Format: PDF
Word Count: 1000 words
Price(USD): 30.0
Delivery: via email in 1~3 business day
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Keywords:
SJ 2658.1-1986, SJ/T 2658.1-1986, SJT 2658.1-1986, SJ2658.1-1986, SJ 2658.1, SJ2658.1, SJ/T2658.1-1986, SJ/T 2658.1, SJ/T2658.1, SJT2658.1-1986, SJT 2658.1, SJT2658.1