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| Position: Chinese Standard in English/SJ 2658.1-1986 |
| SJ 2658.1-1986 Methods of Measurement for Semiconductor Infrared Diodes - General Rules (English Version) | |||
| Standard No.: | SJ 2658.1-1986 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 1000 words | Price(USD): | 184.00 remind me the price change |
| Implemented on: | 1986-10-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | SJ 2658.1-1986 |
| English Name: | Methods of Measurement for Semiconductor Infrared Diodes - General Rules |
| Chinese Name: | 半导体红外发光二极管测试方法 总则 |
| Chinese Classification: | L53 Semiconductor emitting device |
| Professional Classification: | SJ Professional Standard - Electronics |
| Implemented on: | 1986-10-1 |
| Status: | superseded |
| Superseded by: | SJ/T 2658.1-2015 Measuring method for semiconductor infrared-emitting diode -Part 1:General |
| Superseded on: | 2016-4-1 |
| Abolished on: | 2016-04-01 |
| Language: | English |
| File Format: | |
| Word Count: | 1000 words |
| Price(USD): | 184.00 |
| Delivery: | via email in 1~3 business day |