 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
LoginRegister |
| Position: Chinese Standard in English/SJ 2658.10-1986 |
| SJ 2658.10-1986 Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Modulated Wideband (English Version) | |||
| Standard No.: | SJ 2658.10-1986 | Status: | superseded |
| Language: | English | File Format: | |
| Word Count: | 2500 words | Price(USD): | 75.00 remind me the price change |
| Implemented on: | 1986-10-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | SJ 2658.10-1986 |
| English Name: | Methods of Measurement for Semiconductor Infrared Diodes - Methods of Measurement for Modulated Wideband |
| Chinese Name: | 半导体红外发光二极管测试方法 调制带宽的测试方法 |
| Chinese Classification: | L53 Semiconductor emitting device |
| Professional Classification: | SJ Professional Standard - Electronics |
| Implemented on: | 1986-10-1 |
| Status: | superseded |
| Superseded by: | SJ/T 2658.10-2015 Measuring method for semiconductor infrared-emitting diode-Part 10:Modulation bandwidth |
| Superseded on: | 2016-4-1 |
| Abolished on: | 2016-04-01 |
| Language: | English |
| File Format: | |
| Word Count: | 2500 words |
| Price(USD): | 75.00 |
| Delivery: | via email in 1~3 business day |