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| Position: Chinese Standard in English/SJ 3249.1-1989 |
| SJ 3249.1-1989 Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material (English Version) | |||
| Standard No.: | SJ 3249.1-1989 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5000 words | Translation Price(USD): | 300.0 remind me the price change |
| Implemented on: | Delivery: | via email in 1~3 business day | |
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| Standard No.: | SJ 3249.1-1989 |
| English Name: | Methods of measurement for resistivity of semi-insulation Gallium arsenide and Indium phosphide single crystal material |
| Chinese Name: | 半绝缘砷化镓和磷化铟体单晶材料的电阻率测试方法 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 5000 words |
| Translation Price(USD): | 300.0 |
| Delivery: | via email in 1~3 business day |