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| Position: Chinese Standard in English/SJ 3254-1989 |
| SJ 3254-1989 Methods for screen of samples of medium-low power transistors for measurements (English Version) | |||
| Standard No.: | SJ 3254-1989 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 3500 words | Translation Price(USD): | 180.0 remind me the price change |
| Implemented on: | 1989-3-25 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ 3254-1989 |
| English Name: | Methods for screen of samples of medium-low power transistors for measurements |
| Chinese Name: | 中小功率晶体三极管计量专用样管筛选方法 |
| Chinese Classification: | F01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 1989-03-20 |
| Implemented on: | 1989-3-25 |
| Status: | abolished |
| Abolished on: | 2010-01-20 |
| Target Language: | English |
| File Format: | |
| Word Count: | 3500 words |
| Translation Price(USD): | 180.0 |
| Delivery: | via email in 1~3 business day |