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| Position: Chinese Standard in English/SJ/T 10745-1996 |
| SJ/T 10745-1996 Mechanical and climatic test methods for semiconductor integrated circuits (English Version) | |||
| Standard No.: | SJ/T 10745-1996 | Status: | abolished |
| Language: | English | File Format: | |
| Word Count: | 21000 words | Price(USD): | 1210.00 remind me the price change |
| Implemented on: | 1997-1-1 | Delivery: | via email in 1~8 business day |
| Standard No.: | SJ/T 10745-1996 |
| English Name: | Mechanical and climatic test methods for semiconductor integrated circuits |
| Chinese Name: | 半导体集成电路机械和气候试验方法 |
| Chinese Classification: | C01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 1996-11-20 |
| Implemented on: | 1997-1-1 |
| Status: | abolished |
| Abolished on: | 2010-01-20 |
| Superseding: | GB 4590-1984 Mechanical and climatic test methods for semiconductor integrated circuits |
| Language: | English |
| File Format: | |
| Word Count: | 21000 words |
| Price(USD): | 1210.00 |
| Delivery: | via email in 1~8 business day |