SJ/T 11487-2015 English Version, SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer (English Version)

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SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer (English Version)
Standard No.:	SJ/T 11487-2015	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	3000 words	Translation Price(USD):	164.0 remind me the price change Email:
Implemented on:	2015-10-1	Delivery:	via email in 1~3 business day

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Standard No.:	SJ/T 11487-2015
English Name:	Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
Chinese Name:	半绝缘半导体晶片电阻率的无接触测量方法
Professional Classification:	SJ Professional Standard - Electronics
Source Content Issued by:	MIIT
Issued on:	2015-04-30
Implemented on:	2015-10-1
Status:	valid
Target Language:	English
File Format:	PDF
Word Count:	3000 words
Translation Price(USD):	164.0
Delivery:	via email in 1~3 business day

Standard

SJ/T 11487-2015 Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer (English Version)
Standard No.	SJ/T 11487-2015
Status	valid
Language	English
File Format	PDF
Word Count	3000 words
Price(USD)	164.0
Implemented on	2015-10-1
Delivery	via email in 1~3 business day

Detail of SJ/T 11487-2015

Standard No.

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Introduction of SJ/T 11487-2015

本标准规定了半绝缘半导体晶片电阻率的非接触式测量方法。

Contents of SJ/T 11487-2015

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