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Position: Chinese Standard in English/SJ/T 11488-2015
SJ/T 11488-2015   Test method for measuring resistivity hall coefficient and determining hall mobility in semi-insulating GaAs single crystals (English Version)
Standard No.: SJ/T 11488-2015 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 3000 words Translation Price(USD):164.0 remind me the price change

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Implemented on:2015-10-1 Delivery: via email in 1~3 business day

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Standard No.: SJ/T 11488-2015
English Name: Test method for measuring resistivity hall coefficient and determining hall mobility in semi-insulating GaAs single crystals
Chinese Name: 半绝缘砷化镓电阻率、霍尔系数和迁移率测试方法
Professional Classification: SJ    Professional Standard - Electronics
Source Content Issued by: MIIT
Issued on: 2015-04-30
Implemented on: 2015-10-1
Status: valid
Target Language: English
File Format: PDF
Word Count: 3000 words
Translation Price(USD): 164.0
Delivery: via email in 1~3 business day
本标准规定了半绝缘砷化镓单晶电阻率、霍尔系数和霍尔迁移率的测量方法。
Code of China
Standard
SJ/T 11488-2015  Test method for measuring resistivity hall coefficient and determining hall mobility in semi-insulating GaAs single crystals (English Version)
Standard No.SJ/T 11488-2015
Statusvalid
LanguageEnglish
File FormatPDF
Word Count3000 words
Price(USD)164.0
Implemented on2015-10-1
Deliveryvia email in 1~3 business day
Detail of SJ/T 11488-2015
Standard No.
SJ/T 11488-2015
English Name
Test method for measuring resistivity hall coefficient and determining hall mobility in semi-insulating GaAs single crystals
Chinese Name
半绝缘砷化镓电阻率、霍尔系数和迁移率测试方法
Chinese Classification
Professional Classification
SJ
ICS Classification
Issued by
MIIT
Issued on
2015-04-30
Implemented on
2015-10-1
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
3000 words
Price(USD)
164.0
Keywords
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Introduction of SJ/T 11488-2015
本标准规定了半绝缘砷化镓单晶电阻率、霍尔系数和霍尔迁移率的测量方法。
Contents of SJ/T 11488-2015
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