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| Position: Chinese Standard in English/SJ/T 11552-2015 |
| SJ/T 11552-2015 Test methods for measurement of interstitial oxygen content of silicon wafers by infrared absorption with P-polarized radiation incident at the Brewster angle (English Version) | |||
| Standard No.: | SJ/T 11552-2015 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 5000 words | Translation Price(USD): | 164.0 remind me the price change |
| Implemented on: | 2016-4-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ/T 11552-2015 |
| English Name: | Test methods for measurement of interstitial oxygen content of silicon wafers by infrared absorption with P-polarized radiation incident at the Brewster angle |
| Chinese Name: | 以布鲁斯特角入射P偏振辐射红外吸收光谱法测量硅中间隙氧含量 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | Ministry of Industry and Information Technology |
| Issued on: | 2015-10-10 |
| Implemented on: | 2016-4-1 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 5000 words |
| Translation Price(USD): | 164.0 |
| Delivery: | via email in 1~3 business day |