 |
Chinese Classification
Professional Classification
ICS Classification
Latest
News
Value-added Services
|
| Position: Chinese Standard in English/SJ/T 12069-2025 |
| SJ/T 12069-2025 Semiconductor devices-Discrete devicesMeasuring methods for electrical parameters of silicon carbide diode (English Version) | |||
| Standard No.: | SJ/T 12069-2025 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 12500 words | Translation Price(USD): | 375.0 remind me the price change |
| Implemented on: | Delivery: | via email in 1~5 business day | |
| → | → | → |
| Standard No.: | SJ/T 12069-2025 |
| English Name: | Semiconductor devices-Discrete devicesMeasuring methods for electrical parameters of silicon carbide diode |
| Chinese Name: | 半导体器件 分立器件 碳化硅二极管电参数测试方法 |
| Professional Classification: | SJ Professional Standard - Electronics |
| Source Content Issued by: | CMIIT |
| Issued on: | 2025-07-31 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 12500 words |
| Translation Price(USD): | 375.0 |
| Delivery: | via email in 1~5 business day |