Code of China Chinese Classification Professional Classification ICS Classification Latest News Value-added Services

LoginRegister
Position: Chinese Standard in English/SJ/T 2215-2015
SJ/T 2215-2015   Measuring methods for semiconductor photocouplers (English Version)
Standard No.: SJ/T 2215-2015 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 20500 words Price(USD):700.00 remind me the price change
Implemented on:2015-10-1 Delivery: via email in 1~5 business day
Standard No.: SJ/T 2215-2015
English Name: Measuring methods for semiconductor photocouplers
Chinese Name: 半导体光电耦合器测试方法
Professional Classification: SJ    Professional Standard - Electronics
Issued by: MIIT
Issued on: 2015-04-30
Implemented on: 2015-10-1
Status: valid
Superseding:SJ/T 2215.1~2215.14-1982
SJ 2215.7-1982 Method of measurement for collector-emitter reverse breakdown voltage of semiconductor photocouplers (diodes)
SJ 2215.8-1982 Method of measurement for output saturation voltage of semiconductor photocouplers (diodes)
SJ 2215.9-1982 Method of measurement for reverse cut-off current of semiconductor photocouplers transistors
SJ 2215.6-1982 Method of measurement for junction capacitance of semiconductor photocouplers (diodes)
SJ 2215.12-1982 Method of measurement for input-to-output capacitance of semiconductor photocouplers
SJ 2215.3-1982 Method of measurement for forward current of semiconductor photocouplers (diodes)
SJ 2215.1-1982 General procedures of measurement for semiconductor photocouplers
SJ 2215.10-1982 Method of measurement for direct current transfer ratio of semiconductor photocouplers
SJ 2215.13-1982 Method of measurement for input-to-output isolation resistance of semiconductor photocouplers
SJ 2215.14-1982 Method of measurement for input-to-output isolation voltage of semiconductor photocouplers
SJ 2215.4-1982 Method of measurement for reverse current of semiconductor photocouplers (diodes)
SJ 2215.2-1982 Method of measurement for forward voltage of semiconductor photocouplers (diodes)
SJ 2215.11-1982 Method of measurement for pulse rise fall delay and storage time of semiconductor photocouplers
SJ 2215.5-1982 Method of measurement for reverse breakdown voltage of semiconductor photocouplers (diodes)
Language: English
File Format: PDF
Word Count: 20500 words
Price(USD): 700.00
Delivery: via email in 1~5 business day
About Us   |    Contact Us   |    Terms of Service   |    Privacy   |    Cancellation & Refund Policy   |    Payment
Tel: +86-10-8572 5655 | Fax: +86-10-8581 9515 | Email: coc@codeofchina.com | QQ: 672269886
Copyright: TransForyou Co., Ltd. 2008-2040
 
 
Keywords:
SJ/T 2215-2015, SJ 2215-2015, SJT 2215-2015, SJ/T2215-2015, SJ/T 2215, SJ/T2215, SJ2215-2015, SJ 2215, SJ2215, SJT2215-2015, SJT 2215, SJT2215