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| Position: Chinese Standard in English/SJ/Z 9016-1987 |
| SJ/Z 9016-1987 Semiconductor devices--Mechanical and climatic test methods (English Version) | |||
| Standard No.: | SJ/Z 9016-1987 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 9500 words | Translation Price(USD): | 280.0 remind me the price change |
| Implemented on: | 1987-9-14 | Delivery: | via email in 1~3 business day |
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| Standard No.: | SJ/Z 9016-1987 |
| English Name: | Semiconductor devices--Mechanical and climatic test methods |
| Chinese Name: | 半导体器件 机械和气候试验方法 |
| Chinese Classification: | C01 Technical management |
| Professional Classification: | SJ Professional Standard - Electronics |
| Issued on: | 1987-09-14 |
| Implemented on: | 1987-9-14 |
| Status: | valid |
| Superseding: | 参见GB/T 4937-1985 |
| Target Language: | English |
| File Format: | |
| Word Count: | 9500 words |
| Translation Price(USD): | 280.0 |
| Delivery: | via email in 1~3 business day |