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Position: Chinese Standard in English/SY/T 6414-1999
SY/T 6414-1999   Maceral analysis on polished surfaces of whole rocks (English Version)
Standard No.: SY/T 6414-1999 Status:superseded remind me the status change

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Target Language:English File Format:PDF
Word Count: 3000 words Translation Price(USD):90.0 remind me the price change

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Implemented on:1999-12-1 Delivery: via email in 1~3 business day

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,2015-3-1,1999-12-1,14113735629462B0AA4C5EE80F935
Standard No.: SY/T 6414-1999
English Name: Maceral analysis on polished surfaces of whole rocks
Chinese Name: 全岩光片显微组分测定方法
Chinese Classification: E11    Petroleum geology exploration
Professional Classification: SY    Professional Standard - Oil & Gas
Source Content Issued by: SAPCI
Issued on: 1999-5-17
Implemented on: 1999-12-1
Status: superseded
Superseded by:SY/T 6414-2014 Maceral identification and statistical methods on polished surfaces of whole rocks
Superseded on:2015-3-1
Target Language: English
File Format: PDF
Word Count: 3000 words
Translation Price(USD): 90.0
Delivery: via email in 1~3 business day
本标准规定了在偏反光显微镜下,用反射白光和反射荧光测定全岩光片显微组分体积分数的方法。
本标准适用于暗色泥岩、碳酸盐岩和煤光片显微组分的测定。
Code of China
Standard
SY/T 6414-1999  Maceral analysis on polished surfaces of whole rocks (English Version)
Standard No.SY/T 6414-1999
Statussuperseded
LanguageEnglish
File FormatPDF
Word Count3000 words
Price(USD)90.0
Implemented on1999-12-1
Deliveryvia email in 1~3 business day
Detail of SY/T 6414-1999
Standard No.
SY/T 6414-1999
English Name
Maceral analysis on polished surfaces of whole rocks
Chinese Name
全岩光片显微组分测定方法
Chinese Classification
E11
Professional Classification
SY
ICS Classification
Issued by
SAPCI
Issued on
1999-5-17
Implemented on
1999-12-1
Status
superseded
Superseded by
SY/T 6414-2014 Maceral identification and statistical methods on polished surfaces of whole rocks
Superseded on
2015-3-1
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
3000 words
Price(USD)
90.0
Keywords
SY/T 6414-1999, SY 6414-1999, SYT 6414-1999, SY/T6414-1999, SY/T 6414, SY/T6414, SY6414-1999, SY 6414, SY6414, SYT6414-1999, SYT 6414, SYT6414
Introduction of SY/T 6414-1999
本标准规定了在偏反光显微镜下,用反射白光和反射荧光测定全岩光片显微组分体积分数的方法。
本标准适用于暗色泥岩、碳酸盐岩和煤光片显微组分的测定。
Contents of SY/T 6414-1999
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Keywords:
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