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| Position: Chinese Standard in English/T/CIE 144-2022 |
| T/CIE 144-2022 Reliability enhancement test of semiconductor devices (English Version) | |||
| Standard No.: | T/CIE 144-2022 | Status: | valid remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 8500 words | Translation Price(USD): | 255.0 remind me the price change |
| Implemented on: | Delivery: | via email in 1~3 business day | |
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| Standard No.: | T/CIE 144-2022 |
| English Name: | Reliability enhancement test of semiconductor devices |
| Chinese Name: | 半导体器件可靠性强化试验方法 |
| Chinese Classification: | L05 Reliability and maintainability |
| Professional Classification: | T/ Social Organization Standard |
| Source Content Issued by: | CIE |
| Issued on: | 2022-12-31 |
| Status: | valid |
| Target Language: | English |
| File Format: | |
| Word Count: | 8500 words |
| Translation Price(USD): | 255.0 |
| Delivery: | via email in 1~3 business day |