2025-12-5 10.1.6.65
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Position: Chinese Standard in English/T/CIE 150-2022
T/CIE 150-2022   Timing reliability test specification of field programmable gate array(FPGA) (English Version)
Standard No.: T/CIE 150-2022 Status:valid remind me the status change

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Target Language:English File Format:PDF
Word Count: 5500 words Translation Price(USD):165.0 remind me the price change

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Standard No.: T/CIE 150-2022
English Name: Timing reliability test specification of field programmable gate array(FPGA)
Chinese Name: 现场可编程门阵列(FPGA)芯片时序可靠性测试规范
Chinese Classification: L05    Reliability and maintainability
Professional Classification: T/    Social Organization Standard
Source Content Issued by: CIE
Issued on: 2022-12-31
Status: valid
Target Language: English
File Format: PDF
Word Count: 5500 words
Translation Price(USD): 165.0
Delivery: via email in 1~3 business day
Code of China
Standard
T/CIE 150-2022  Timing reliability test specification of field programmable gate array(FPGA) (English Version)
Standard No.T/CIE 150-2022
Statusvalid
LanguageEnglish
File FormatPDF
Word Count5500 words
Price(USD)165.0
Implemented on
Deliveryvia email in 1~3 business day
Detail of T/CIE 150-2022
Standard No.
T/CIE 150-2022
English Name
Timing reliability test specification of field programmable gate array(FPGA)
Chinese Name
现场可编程门阵列(FPGA)芯片时序可靠性测试规范
Chinese Classification
L05
Professional Classification
T/
ICS Classification
Issued by
CIE
Issued on
2022-12-31
Implemented on
Status
valid
Superseded by
Superseded on
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
5500 words
Price(USD)
165.0
Keywords
T/CIE 150-2022, T/CIET 150-2022, TCIET 150-2022, T/CIE150-2022, T/CIE 150, T/CIE150, T/CIET150-2022, T/CIET 150, T/CIET150, TCIET150-2022, TCIET 150, TCIET150
Introduction of T/CIE 150-2022
Contents of T/CIE 150-2022
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Keywords:
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