YD/T 3037.2-2023 English Version, YD/T 3037.2-2023 Test methods for Mass Storage characteristic between UICC and terminal interface Part 2:UICC (English Version)

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YD/T 3037.2-2023 Test methods for Mass Storage characteristic between UICC and terminal interface Part 2:UICC (English Version)
Standard No.:	YD/T 3037.2-2023	Status:	valid remind me the status change Email:
Target Language:	English	File Format:	PDF
Word Count:	38000 words	Translation Price(USD):	3010.0 remind me the price change Email:
Implemented on:	2024-7-1	Delivery:	via email in 1~5 business day

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Standard No.:	YD/T 3037.2-2023
English Name:	Test methods for Mass Storage characteristic between UICC and terminal interface Part 2:UICC
Chinese Name:	通用集成电路卡（UICC）与终端间大容量存储接口特性测试方法第2部分：UICC
Professional Classification:	YD Professional Standard - Telecommunication
Source Content Issued by:	MIIT
Issued on:	2023-12-29
Implemented on:	2024-7-1
Status:	valid
Superseding:	YD/T 3037.2-2016 Test methods for USB characteristic between UICC and terminal interface - Part 2: UICC
Target Language:	English
File Format:	PDF
Word Count:	38000 words
Translation Price(USD):	3010.0
Delivery:	via email in 1~5 business day

Standard

YD/T 3037.2-2023 Test methods for Mass Storage characteristic between UICC and terminal interface Part 2:UICC (English Version)
Standard No.	YD/T 3037.2-2023
Status	valid
Language	English
File Format	PDF
Word Count	38000 words
Price(USD)	3010.0
Implemented on	2024-7-1
Delivery	via email in 1~5 business day

Detail of YD/T 3037.2-2023

Standard No.

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Introduction of YD/T 3037.2-2023

本文件规定了通用集成电路卡（UICC）与终端间大容量存储接口特性的UICC部分测试方法，主要包括：物理特性、电气特性、初始通信协议的建立、功能测试和性能测试。
本文件适用于支持大容量存储接口的UICC卡的研发和生产。

Contents of YD/T 3037.2-2023

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Keywords:
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