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| YS/T 1864-2026 (English Version) |
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Detail of YS/T 1864-2026
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Introduction of YS/T 1864-2026
本文件描述了电感耦合等离子体质谱仪（ICP-MS）测定流化床法颗粒硅表面金属杂质元素含量的方法。
本文件适用于流化床法颗粒硅表面金属杂质元素如铁、铬、镍、铜、钠、镁、铝、钾、钙、锌、钛、钼、钨、钴、锰等含量的测定，各元素测定范围为 0.05ng/g～1000ng/g。
Contents of YS/T 1864-2026