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Standard Insuued on: 1982-02

SJ 2065-1982    Testing method for diffusion furnace for semiconductor device manufacturing
半导体器件生产用扩散炉测试方法
Category No.:SJ Valid Status:valid
Issued Organization:MIIT Issued Date:1982-02-18
Implemented Date:1982-7-1 Abolished Date:
Superseded Standard.: Superseded Date:
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GB 2894-2008   CB* 3129-1982   SJ 2057-1982   GB 2895-1982   GB/T 2904-1982   GB/T 718-1982   SJ 2057   SJ 2065-1982  

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