2024-11-21 18.117.75.218
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Code of China
Chinese National Standard List: Semimetal and semiconductor material in general

GB/T 14264-2024 Terminology of semiconductor materials 
  Issued on: 2024-4-25   Price(USD): 1260.0
GB/T 43612-2023 Collection of metallographs on defects in silicon carbide crystal materials 
  Issued on: 2023-12-28   Price(USD): 735.0
GB/T 29057-2023 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy  
  Issued on: 2023-08-06   Price(USD): 255.0
GB/T 16596-2019 Specification for establishing a wafer coordinate system  
  Issued on: 2019-03-25   Price(USD): 80.0
GB/T 16595-2019 Specification for a universal wafer grid  
  Issued on: 2019-03-25   Price(USD): 130.0
GB/T 14844-2018 Designations of semiconductor materials 
  Issued on: 2018-12-28   Price(USD): 160.0
GB/T 8756-2018 Collection of metallographs on defects of germanium crystal 
  Issued on: 2018-12-28   Price(USD): 610.0
GB/T 37051-2018 Test method for determination of crystal defect density in PV silicon ingot and wafer 
  Issued on: 2018-12-28   Price(USD): 160.0
GB/T 34479-2017 Specification for alphanumeric marking of silicon wafers 
  Issued on: 2017-10-14   Price(USD): 210.0
GB/T 32279-2015 pecification for order entry format of silicon wafers 
  Issued on: 2015-12-10   Price(USD): 270.0
YS/T 985-2014 Polished reclaimed silicon wafers 
  Issued on: 2014-10-14   Price(USD): 220.0
GB/T 30453-2013 Metallographs Collection for Original Defects of Crystalline Silicon 
  Issued on: 2013-12-31   Price(USD): 1200.0
GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes 
  Issued on: 2013-12-31   Price(USD): 210.0
GB/T 30110-2013 Measuring Methods of Parameters of Hgcdte Epilayers Used for Space Infrared Detectors 
  Issued on: 2013-12-17   Price(USD): 480.0
GB/T 29505-2013 Test method for measuring surface roughness on planar surfaces of silicon wafer 
  Issued on: 2013-5-9   Price(USD): 430.0
GB/T 29507-2013 Test method for measuring flatness, thickness and total thickness vsriation on silicon wafers. Automated non-contact scanning 
  Issued on: 2013-05-09   Price(USD): 260.0
GB/T 29057-2012 Practice for evaluation of polocrystalline silicon rods by float-zone crystal growth and spectroscopy 
  Issued on: 2012-12-31   Price(USD): 270.0
YS/T 838-2012 Cadmium Telluride 
  Issued on: 2012-11-7   Price(USD): 210.0
GB/T 26069-2010 Specification for silicon annealed wafers 
  Issued on: 2011-1-10   Price(USD): 180.0
GB/T 26071-2010 Mono-crystalline silicon as cut slices for photovoltaic solar cells 
  Issued on: 2011-1-10   Price(USD): 180.0
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