2025-12-29 10.8.118.215
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Code of China
International Standard List: Semiconducting materials

GB/T 12963-2014 Electronic-grade polycrystalline silicon 
  Issued on: 2014-12-31   Translation Price(USD): 80.0
GB/T 31092-2014 Monocrystalline sapphire ingot 
  Issued on: 2014-12-22   Translation Price(USD): 330.0
GB/T 13389-2014 Practice for conversion between resistivity and dopant density for boron-doped,phosphorus-doped,and arsenic-doped silicon 
  Issued on: 2014-12-31   Translation Price(USD): 430.0
GB/T 2881-2014 Silicon metal 
  Issued on: 2014-12-05   Translation Price(USD): 140.0
YS/T 988-2014 Carboxyethyl-germanium sesquioxide 
  Issued on: 2014-10-14   Translation Price(USD): 105.0
GB/T 30856-2014 GaAs substrates for LED epitaxial chips 
  Issued on: 2014-07-24   Translation Price(USD): 220.0
GB/T 30861-2014 Germanium substrate for solar cell 
  Issued on: 2014-07-24   Translation Price(USD): 130.0
GB/T 30854-2014 Gallium nitride based epitaxial layer for LED lighting 
  Issued on: 2014-07-24   Translation Price(USD): 370.0
YS/T 986-2014 Specification for serial alphanumeric marking of the front surface of wafers 
  Issued on: 2014-10-14   Translation Price(USD): 200.0
YS/T 982-2014 Carbon/carbon U shape heating element of hydrogenation furnace 
  Issued on: 2014-10-14   Translation Price(USD): 160.0
YS/T 985-2014 Polished reclaimed silicon wafers 
  Issued on: 2014-10-14   Translation Price(USD): 220.0
YS/T 978-2014 Carbon/carbon composites guide shield of single crystal furnace 
  Issued on: 2014-10-14   Translation Price(USD): 160.0
YS/T 979-2014 High purity gallium oxide 
  Issued on: 2014-10-14   Translation Price(USD): 100.0
GB/T 30855-2014 GaP substrates for LED epitaxial chips 
  Issued on: 2014-07-24   Translation Price(USD): 220.0
YS/T 989-2014 Germanium grain 
  Issued on: 2014-10-14   Translation Price(USD): 100.0
GB/T 30867-2014 Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers 
  Issued on: 2014-07-24   Translation Price(USD): 90.0
GB/T 30868-2014 Test method for measuring micropipe density of monocrystalline silicon carbide wafers―Chemically etching  
  Issued on: 2014-07-24   Translation Price(USD): 90.0
GB/T 30453-2013 Metallographs Collection for Original Defects of Crystalline Silicon 
  Issued on: 2013-12-31   Translation Price(USD): 1200.0
GB/T 14863-2013 Method for net carrier density in silicon epitaxial layers by voltage-capacitance of gated and ungated diodes 
  Issued on: 2013-12-31   Translation Price(USD): 210.0
GB/T 29850-2013 Test method for measuring compensation degree of silicon materials used for photovoltaic applications 
  Issued on: 2013-11-12   Translation Price(USD): 120.0
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