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Position: Chinese Standard in English/GB/T 30867-2014
GB/T 30867-2014   Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers (English Version)
Standard No.: GB/T 30867-2014 Status:valid remind me the status change
Language:English File Format:PDF
Word Count: 3500 words Price(USD):90.00 remind me the price change
Implemented on:2015-2-1 Delivery: via email in 1~3 business day
Standard No.: GB/T 30867-2014
English Name: Test method for measuring thickness and total thickness variation of monocrystalline silicon carbide wafers
Chinese Name: 碳化硅单晶片厚度和总厚度变化测试方法
Chinese Classification: H83    Compound semiconductor material
Professional Classification: GB    National Standard
ICS Classification: 29.045 29.045    Semiconducting materials 29.045
Issued by: AQSIQ; SAC
Issued on: 2014-07-24
Implemented on: 2015-2-1
Status: valid
Language: English
File Format: PDF
Word Count: 3500 words
Price(USD): 90.00
Delivery: via email in 1~3 business day
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