| Standard No. |
Title |
Price(USD) |
Delivery |
Status |
Add to Cart |
| GB 2142-1980 |
Determination of copper content in tellurium--Neocuproine Chloroform extraction photometric method |
$184.00 |
via email in 1~3 business day |
superseded,1996-3-12,1981-10-1 |
|
| GB 2143-1980 |
Determination of sulphur content in tellurium--Barium sulfate turbidimetry |
$184.00 |
via email in 1~3 business day |
superseded,1996-3-12,1981-10-1 |
|
| GB 2144-1980 |
Determination of magnesium and sodium contents in tellurium--Atomic absorption spectrophotometric method |
$184.00 |
via email in 1~3 business day |
superseded,1996-3-12,1981-10-1 |
|
| GB 2145-1980 |
Determination of tellurium content in tellurium--Potassium dichromate-ammonium ferrous sulfate volumetric method |
$184.00 |
via email in 1~3 business day |
superseded,1996-3-12,1981-10-1 |
|
| GB 2146-1980 |
Determination of arsenic content in tellurium--n-butyl alcohol extraction arsenic-molybdenum blue photometric method |
$184.00 |
via email in 1~3 business day |
superseded,1996-3-12,1981-10-1 |
|
| GB 2147-1980 |
Determination of silicon content in tellurium--n-butyl alcohol extraction silicon-molybdenum blue photometric method |
$184.00 |
via email in 1~3 business day |
superseded,1996-3-12,1981-10-1 |
|
| GB 4298-1984 |
The activation analysis method for the determination of elemental impurities in semiconductor silicon materials |
$210.00 |
via email in 1~3 business day |
abolished2017-12-15,,1985-3-1 |
|
| GB 4700.4-1984 |
Methods for chemical analysis of calcium-silicon - The phosphorus molybdenum blues photometry for the determination of phosphorus content |
$15.00 |
via email in 1~3 business day |
superseded,1999-7-1,1985-9-1 |
|
| GB/T 11073-2007 |
Standard method for measuring radial resistivity variation on silicon slices |
$210.00 |
via email in 1~3 business day |
valid,,2008-2-1 |
|
| GB/T 14849.1-1993 |
Silicon metal－Determination of iron content－1,10-Phenanthroline spectrophotometric method |
$184.00 |
via email in 1~3 business day |
superseded,2008-4-1,1994-9-1 |
|
| GB/T 14849.2-1993 |
Silicon metal--Determination of aluminium content--Chrome azurol S spectrophotometric method |
$184.00 |
via email in 1~3 business day |
superseded,2008-4-1,1994-9-1 |
|
| GB/T 14849.3-1993 |
Silicon metal--Determination of calciumcontent |
$224.00 |
via email in 1~3 business day |
superseded,2008-4-1,1994-9-1 |
|
| GB/T 14849.4-2008 |
for chemical analysis of silicon metal - Part 4: Determination of elements content Inductively coupled plasma atomic emission spectrometric method |
$60.00 |
via email in 1~3 business day |
superseded,2015-8-1,2008-12-1 |
|
| GB/T 1557-2018 |
Test method for determining interstitial oxygen content in silicon by infrared absorption |
$165.00 |
via email in 1~3 business day |
valid,,2019-6-1 |
|
| GB/T 1558-2023 |
Test method for substitutional carbon content in silicon by infrared absorption |
$165.00 |
via email in 1~3 business day |
valid,,2024-7-1 |
|
| GB/T 17170-2015 |
Test method for the EL2 deep donor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy |
$90.00 |
via email in 1~3 business day |
valid,,2016-7-1 |
|
| GB/T 19199-2015 |
Test methods for carbon acceptor concentration in semi-insulating gallium arsenide single crystals by infrared absorption spectroscopy |
$90.00 |
via email in 1~3 business day |
valid,,2016-7-1 |
|
| GB/T 19921-2005 |
Test method of particles on silicon wafer surfaces |
$120.00 |
via email in 1~3 business day |
superseded,2019-7-1,2006-4-1 |
|
| GB/T 19922-2005 |
Standard test methods for measuring site flatness on silicon wafers by noncontact scanning |
$150.00 |
via email in 1~3 business day |
valid,,2006-4-1 |
|
| GB/T 24578-2015 |
Test method for measuring surface metal contamination on silicon wafers by total reflection X-Ray fluorescence spectroscopy |
$210.00 |
via email in 1~3 business day |
superseded,2025-2-1,2017-1-1 |
|
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