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| Position: Chinese Standard in English/GB/T 32281-2015 |
| GB/T 32281-2015 Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry (English Version) | |||
| Standard No.: | GB/T 32281-2015 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 5500 words | Price(USD): | 150.00 remind me the price change |
| Implemented on: | 2017-1-1 | Delivery: | via email in 1~3 business day |
| Standard No.: | GB/T 32281-2015 |
| English Name: | Test method for measuring oxygen, carbon, boron and phosphorus in solar silicon wafers and feedstock by secondary ion mass spectrometry |
| Chinese Name: | 太阳能级硅片和硅料中氧、碳、硼和磷量的测定 二次离子质谱法 |
| Chinese Classification: | H17 Semimetal and semiconductor material analysis method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.30 Chemical analysis of metals |
| Issued by: | AQSIQ;SAC |
| Issued on: | 2015-12-10 |
| Implemented on: | 2017-1-1 |
| Status: | valid |
| Language: | English |
| File Format: | |
| Word Count: | 5500 words |
| Price(USD): | 150.00 |
| Delivery: | via email in 1~3 business day |