Standard No.:	YS/T 981.1-2014
English Name:	Methods for chemical analysis of high purity indium―Determination of magnesiumaluminumsiliconsulphurironnickelcopperzinc,arsenic,silver,cadmium,tin,thallium,lead content―High mass resolution glow discharge mass specrometry
Chinese Name:	高纯铟化学分析方法 镁、铝、硅、硫、铁、镍、铜、锌、砷、银、镉、锡、铊、铅的测定 高质量分辨率辉光放电质谱法
Chinese Classification:	H17    Semimetal and semiconductor material analysis method
Professional Classification:	YS    Professional Standard - Non-ferrous Metal
ICS Classification:	77.040.30 77.040.30    Chemical analysis of metals 77.040.30
Source Content Issued by:	MIIT
Issued on:	2014-10-14
Implemented on:	2015-4-1
Status:	superseded
Superseded by:	YS/T 981.1-2024 Methods for chemical analysis of high purity indium—Part 1: Determination of trace impurity elements content—Glow discharge mass spectrometry
Superseded on:	2025-5-1
Abolished on:	2025-05-01
Target Language:	English
File Format:	PDF
Word Count:	5500 words
Translation Price(USD):	160.0
Delivery:	via email in 1~3 business day

本部分规定了用高质量分辨率辉光放电质谱法测定99.999%以上高纯铟中镁、铝、硅、硫、铁、镍、铜、锌、砷、银、镉、锡、铊、铅元素含量的方法。
本部分适用于高纯铟中镁、铝、硅、硫、铁、镍、铜、锌、砷、银、镉、锡、铊、铅的测定，各元素测定范围: 5.0×10-7%～1.0×10-3%。