2025-12-21 10.8.118.215
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
Position: Search valid to be valid superseded to be superseded abolished to be abolished
Standard No. Title Price(USD) Delivery Status Add to Cart
YS/T 519.4-2006 Methods for chemical analysis of arsenic The dithiodiantipyryl methane photometric method for the determination of kismuth content 184.0 via email in 1~3 business day superseded,2010-6-1,2006-10-11
YB/T 5312-2006 Methods for chemical analysis of calcium-silicon 70.0 via email in 1~3 business day superseded,2016-9-1,2006-10-11
GB 2123-1980 Determination of carbon content in selenium--Combustion conductometric titration method 184.0 via email in 1~3 business day superseded,1993-3-1,1981-10-1
YS/T 1059-2015 Determination of total carbon content in trichlorosilane for silicon eqitaxy―Gas chromatographic method 144.0 via email in 1~3 business day valid,,2015-10-1
GB/T 4700.3-1984 Methods for chemical analysis of calcium-silicon;The EDTA titrimetric method for the determination of aluminum content 184.0 via email in 1~3 business day superseded2007-09-29,2006-10-11,1985-9-1
GB/T 35309-2017 Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies 160.0 via email in 1~3 business day valid,,2018-7-1
YS/T 34.3-1992 Methods for chemical analysis of the high-purity arsenic—Predicating method for determinating the concentration of selenium 184.0 via email in 1~3 business day superseded,2012-7-1,1993-1-1
GB 2120-1980 Determination of magnesium, copper, iron and nickel content in selenium--Atomic absorption spectrophotometric method 184.0 via email in 1~3 business day superseded,1993-3-1,1981-10-1
GB 2116-1980 Determination of silicon content in selenium--Silicon-molybdenum blue photometric method 184.0 via email in 1~3 business day superseded,1996-3-12,1981-10-1
GB/T 35306-2017 Test method for carbon and oxygen content of single crystal silicon―Low temperature fourier transform infrared spectrometry 165.0 via email in 1~3 business day superseded,2024-3-1,2018-7-1
YS/T 37.1-1992 High pure germanium dioxide—Determination of chlorine content—Mercuric sulfocyanide spectrophotometric method 184.0 via email in 1~3 business day superseded,2007-10-1,1993-1-1
YS/T 226.12-2009 Methods for chemical analysis of selenium - Part 12: Determination of selenium content - Sodium thiosulphate titrimetric method 105.0 via email in 1~3 business day valid,,2010-6-1
YS/T 227.7-1994 Determination of sulphur content in tellurium--Barium sulfate turbidimetry 15.0 via email in 1~3 business day superseded,2011-3-1,1996-3-12
YS/T 226.7-2009 Methods for chemical analysis of selenium Part 7: Determination of magnesium content-Flame atomic absorption spectrometry 90.0 via email in 1~3 business day valid,,2010-6-1
GB 2117-1980 Determination of boron content in selenium--Methylene blue photometric method 180.0 via email in 1~3 business day valid,,1981-10-1
GB/T 32277-2015 Test method for instrumental neutron activation analysis (INAA) of silicon 260.0 via email in 1~3 business day valid,,2017-1-1
GB/T 26070-2010 Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method 240.0 via email in 1~3 business day valid,,2011-10-1
YB/T 5314-2006 Methods for chemical analysis of calcium-silicon - The EDTA titrimetric method for the determination of aluminum content 80.0 via email in 1~3 business day superseded,2016-9-1,2006-10-11
YS/T 519.1-2009 Methods for chemical analysis of arsenic - Part 1: Determination of arsenic content - Potassium bromate titrimetric method 114.0 via email in 1~3 business day valid,,2010-6-1
GB/T 19921-2005 Test method of particles on silicon wafer surfaces 120.0 via email in 1~3 business day superseded,2019-7-1,2006-4-1
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YS/T 519.4-2006 Methods for chemical analysis of arsenic The dithiodiantipyryl methane photometric method for the determination of kismuth content 
  Issued on: 2006-07-27   Price(USD): 184.0
YB/T 5312-2006 Methods for chemical analysis of calcium-silicon 
  Issued on: 2006-7-27   Price(USD): 70.0
GB 2123-1980 Determination of carbon content in selenium--Combustion conductometric titration method 
  Issued on:   Price(USD): 184.0
YS/T 1059-2015 Determination of total carbon content in trichlorosilane for silicon eqitaxy―Gas chromatographic method 
  Issued on: 2015-04-30   Price(USD): 144.0
GB/T 4700.3-1984 Methods for chemical analysis of calcium-silicon;The EDTA titrimetric method for the determination of aluminum content 
  Issued on: 1984-10-04   Price(USD): 184.0
GB/T 35309-2017 Practice for evaluation of granular polysilicon by melter-zoner and spectroscopies 
  Issued on: 2017-12-29   Price(USD): 160.0
YS/T 34.3-1992 Methods for chemical analysis of the high-purity arsenic—Predicating method for determinating the concentration of selenium 
  Issued on: 1992-03-13   Price(USD): 184.0
GB 2120-1980 Determination of magnesium, copper, iron and nickel content in selenium--Atomic absorption spectrophotometric method 
  Issued on:   Price(USD): 184.0
GB 2116-1980 Determination of silicon content in selenium--Silicon-molybdenum blue photometric method 
  Issued on:   Price(USD): 184.0
GB/T 35306-2017 Test method for carbon and oxygen content of single crystal silicon―Low temperature fourier transform infrared spectrometry 
  Issued on: 2017-12-29   Price(USD): 165.0
YS/T 37.1-1992 High pure germanium dioxide—Determination of chlorine content—Mercuric sulfocyanide spectrophotometric method 
  Issued on:   Price(USD): 184.0
YS/T 226.12-2009 Methods for chemical analysis of selenium - Part 12: Determination of selenium content - Sodium thiosulphate titrimetric method 
  Issued on: 2009-12-4   Price(USD): 105.0
YS/T 227.7-1994 Determination of sulphur content in tellurium--Barium sulfate turbidimetry 
  Issued on:   Price(USD): 15.0
YS/T 226.7-2009 Methods for chemical analysis of selenium Part 7: Determination of magnesium content-Flame atomic absorption spectrometry 
  Issued on: 2009-12-4   Price(USD): 90.0
GB 2117-1980 Determination of boron content in selenium--Methylene blue photometric method 
  Issued on:   Price(USD): 180.0
GB/T 32277-2015 Test method for instrumental neutron activation analysis (INAA) of silicon 
  Issued on: 2015-12-10   Price(USD): 260.0
GB/T 26070-2010 Characterization of subsurface damage in polished compound semiconductor wafers by reflectance difference spectroscopy method 
  Issued on: 2011-1-10   Price(USD): 240.0
YB/T 5314-2006 Methods for chemical analysis of calcium-silicon - The EDTA titrimetric method for the determination of aluminum content 
  Issued on: 2006-7-27   Price(USD): 80.0
YS/T 519.1-2009 Methods for chemical analysis of arsenic - Part 1: Determination of arsenic content - Potassium bromate titrimetric method 
  Issued on: 2009-12-4   Price(USD): 114.0
GB/T 19921-2005 Test method of particles on silicon wafer surfaces 
  Issued on: 2005-9-19   Price(USD): 120.0
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