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Position: Chinese Standard in English/GB/T 19921-2005
GB/T 19921-2005   Test method of particles on silicon wafer surfaces (English Version)
Standard No.: GB/T 19921-2005 Status:superseded remind me the status change

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Target Language:English File Format:PDF
Word Count: 4000 words Translation Price(USD):120.0 remind me the price change

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Implemented on:2006-4-1 Delivery: via email in 1~3 business day

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,2019-7-1,2006-4-1,14113818180787BC2336C0EFC063F
Standard No.: GB/T 19921-2005
English Name: Test method of particles on silicon wafer surfaces
Chinese Name: 硅抛光片表面颗粒测试方法
Chinese Classification: H17    Semimetal and semiconductor material analysis method
Professional Classification: GB    National Standard
ICS Classification: 77.040.01 77.040.01    Testing of metals in general 77.040.01
Source Content Issued by: AQSIQ; SAC
Issued on: 2005-9-19
Implemented on: 2006-4-1
Status: superseded
Superseded by:GB/T 19921-2018 Test method for particles on polished silicon wafer surfaces
Superseded on:2019-7-1
Target Language: English
File Format: PDF
Word Count: 4000 words
Translation Price(USD): 120.0
Delivery: via email in 1~3 business day
本标准规定了应用扫描表面检查系统(SSIS)对硅抛光片表面颗粒进行测试、计数和报告的程序。本标准适用于硅抛光片,也可适用于硅外延片或其他镜面抛光片(如化合物抛光片)。本标准也适用于观测硅抛光片表面的划痕、桔皮、凹坑、波纹等缺陷,但这些缺陷的检测、分类依赖于设备的功能,并与检测时的初始设置有关。
Code of China
Standard
GB/T 19921-2005   Test method of particles on silicon wafer surfaces (English Version)
Standard No.GB/T 19921-2005
Statussuperseded
LanguageEnglish
File FormatPDF
Word Count4000 words
Price(USD)120.0
Implemented on2006-4-1
Deliveryvia email in 1~3 business day
Detail of GB/T 19921-2005
Standard No.
GB/T 19921-2005
English Name
Test method of particles on silicon wafer surfaces
Chinese Name
硅抛光片表面颗粒测试方法
Chinese Classification
H17
Professional Classification
GB
ICS Classification
Issued by
AQSIQ; SAC
Issued on
2005-9-19
Implemented on
2006-4-1
Status
superseded
Superseded by
GB/T 19921-2018 Test method for particles on polished silicon wafer surfaces
Superseded on
2019-7-1
Abolished on
Superseding
Language
English
File Format
PDF
Word Count
4000 words
Price(USD)
120.0
Keywords
GB/T 19921-2005, GB 19921-2005, GBT 19921-2005, GB/T19921-2005, GB/T 19921, GB/T19921, GB19921-2005, GB 19921, GB19921, GBT19921-2005, GBT 19921, GBT19921
Introduction of GB/T 19921-2005
本标准规定了应用扫描表面检查系统(SSIS)对硅抛光片表面颗粒进行测试、计数和报告的程序。本标准适用于硅抛光片,也可适用于硅外延片或其他镜面抛光片(如化合物抛光片)。本标准也适用于观测硅抛光片表面的划痕、桔皮、凹坑、波纹等缺陷,但这些缺陷的检测、分类依赖于设备的功能,并与检测时的初始设置有关。
Contents of GB/T 19921-2005
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Keywords:
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