2025-12-5 10.1.6.65
Code of China Chinese Standard Classification Professional Classification ICS Classification Latest
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Standard No. Title Price(USD) Delivery Status Add to Cart
GB/T 46057-2025 Microbeam analysis—Scanning electron microscopy—Method for evaluating critical dimensions by CD-SEM 630.0 via email in 1~8 business day to be valid,,2026-3-1
GB/T 45772-2025 Surface chemical analysis—Electron spectroscopies—Procedures for identifying; estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy 375.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 45773-2025 Surface chemical analysis—Near real-time information from the X-ray photoelectron spectroscopy survey scan—Rules for identification of; and correction for; surface contamination by carbon-containing compounds 405.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 45770-2025 Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement 435.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 45769-2025 Surface chemical analysis—X-ray photoelectron spectroscopy—Estimating and reporting detection limits for elements in homogeneous materials 435.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 45768-2025 Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers 375.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 42658.3-2025 Surface chemical analysis—Sample handling; preparation and mounting—Part 3: Biomaterials 270.0 via email in 1~3 business day to be valid,,2026-1-1
GB/T 32996-2025 Surface chemical analysis—Analysis of metal oxide films by glow discharge optical emission spectrometry 645.0 via email in 1~8 business day to be valid,,2026-1-1
GB/T 20176-2025 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of boron atomic concentration in silicon using uniformly doped materials 375.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 20175-2025 Surface chemical analysis—Sputter depth profiling—Optimization using layered systems as reference materials 375.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 19500-2025 Surface chemical analysis—General rules for X-ray photoelectron spectroscopic analysis method 555.0 via email in 1~5 business day to be valid,,2026-1-1
GB/T 28634-2025 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy 255.0 via email in 1~3 business day valid,,2025-11-1
GB/T 45469-2025 Microbeam analysis—Transmission electron microscopy—Preparation methods of ultrathin section of polymer composites 315.0 via email in 1~5 business day valid,,2025-10-1
GB/T 45468-2025 Microbeam analysis—FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample 345.0 via email in 1~5 business day valid,,2025-10-1
GB/T 45459-2025 Microbeam analysis—Focused ion beam—Preparation of TEM specimens 285.0 via email in 1~3 business day valid,,2025-10-1
GB/T 14666-2025 Terms for analytical chemistry 1905.0 via email in 1~5 business day valid,,2025-8-1
T/CCASC 0047-2024 Calculation method for fresh water consumption and waste residue generation of propylene oxide by chlorohydrin method via email in business day valid,,2025-3-15
T/CCASC 0051-2024 Technical specifications for purification of chlor-alkali by-product hydrogen 270.0 via email in 1~3 business day valid,,2025-3-15
T/CCASC 0046-2024 Calculation method for fresh water consumption and waste residue generation of epichlorohydrin by chlorohydrin method via email in business day valid,,2025-3-15
T/CCASC 0052-2024 Detection of hexachlorobutadiene―Gas chromatography-mass spectrometry 270.0 via email in 1~3 business day valid,,2025-3-15
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GB/T 46057-2025 Microbeam analysis—Scanning electron microscopy—Method for evaluating critical dimensions by CD-SEM 
  Issued on: 2025-08-29   Price(USD): 630.0
GB/T 45772-2025 Surface chemical analysis—Electron spectroscopies—Procedures for identifying; estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy 
  Issued on: 2025-06-30   Price(USD): 375.0
GB/T 45773-2025 Surface chemical analysis—Near real-time information from the X-ray photoelectron spectroscopy survey scan—Rules for identification of; and correction for; surface contamination by carbon-containing compounds 
  Issued on: 2025-06-30   Price(USD): 405.0
GB/T 45770-2025 Surface chemical analysis—Atomic force microscopy—Procedure for in situ characterization of AFM probe shank profile used for nanostructure measurement 
  Issued on: 2025-06-30   Price(USD): 435.0
GB/T 45769-2025 Surface chemical analysis—X-ray photoelectron spectroscopy—Estimating and reporting detection limits for elements in homogeneous materials 
  Issued on: 2025-06-30   Price(USD): 435.0
GB/T 45768-2025 Surface chemical analysis—Secondary ion mass spectrometry—Linearity of intensity scale in single ion counting time-of-flight mass analysers 
  Issued on: 2025-06-30   Price(USD): 375.0
GB/T 42658.3-2025 Surface chemical analysis—Sample handling; preparation and mounting—Part 3: Biomaterials 
  Issued on: 2025-06-30   Price(USD): 270.0
GB/T 32996-2025 Surface chemical analysis—Analysis of metal oxide films by glow discharge optical emission spectrometry 
  Issued on: 2025-06-30   Price(USD): 645.0
GB/T 20176-2025 Surface chemical analysis—Secondary-ion mass spectrometry—Determination of boron atomic concentration in silicon using uniformly doped materials 
  Issued on: 2025-06-30   Price(USD): 375.0
GB/T 20175-2025 Surface chemical analysis—Sputter depth profiling—Optimization using layered systems as reference materials 
  Issued on: 2025-06-30   Price(USD): 375.0
GB/T 19500-2025 Surface chemical analysis—General rules for X-ray photoelectron spectroscopic analysis method 
  Issued on: 2025-06-30   Price(USD): 555.0
GB/T 28634-2025 Microbeam analysis—Electron probe microanalysis—Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy 
  Issued on: 2025-04-25   Price(USD): 255.0
GB/T 45469-2025 Microbeam analysis—Transmission electron microscopy—Preparation methods of ultrathin section of polymer composites 
  Issued on: 2025-03-28   Price(USD): 315.0
GB/T 45468-2025 Microbeam analysis—FIB-SEM imaging and analysis method for 3D micro-pore structure of rock sample 
  Issued on: 2025-03-28   Price(USD): 345.0
GB/T 45459-2025 Microbeam analysis—Focused ion beam—Preparation of TEM specimens 
  Issued on: 2025-03-28   Price(USD): 285.0
GB/T 14666-2025 Terms for analytical chemistry 
  Issued on: 2025-01-24   Price(USD): 1905.0
T/CCASC 0047-2024 Calculation method for fresh water consumption and waste residue generation of propylene oxide by chlorohydrin method 
  Issued on: 2024-12-15   Price(USD):
T/CCASC 0051-2024 Technical specifications for purification of chlor-alkali by-product hydrogen 
  Issued on: 2024-12-15   Price(USD): 270.0
T/CCASC 0046-2024 Calculation method for fresh water consumption and waste residue generation of epichlorohydrin by chlorohydrin method 
  Issued on: 2024-12-15   Price(USD):
T/CCASC 0052-2024 Detection of hexachlorobutadiene―Gas chromatography-mass spectrometry 
  Issued on: 2024-12-15   Price(USD): 270.0
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