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| Position: Chinese Standard in English/GB 1553-1979 |
| GB 1553-1979 Measurement of monocrystalline silicon lifetime by D. C photoconductive decay methods (English Version) | |||
| Standard No.: | GB 1553-1979 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 3500 words | Translation Price(USD): | 300.0 remind me the price change |
| Implemented on: | 1980-1-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB 1553-1979 |
| English Name: | Measurement of monocrystalline silicon lifetime by D. C photoconductive decay methods |
| Chinese Name: | 硅单晶寿命直流光电导衰退测量方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Implemented on: | 1980-1-1 |
| Status: | superseded |
| Superseded by: | GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay |
| Superseded on: | 1997-1-2 |
| Target Language: | English |
| File Format: | |
| Word Count: | 3500 words |
| Translation Price(USD): | 300.0 |
| Delivery: | via email in 1~3 business day |