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| Position: Chinese Standard in English/GB/T 1553-1997 |
| GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay (English Version) | |||
| Standard No.: | GB/T 1553-1997 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 8000 words | Translation Price(USD): | 240.0 remind me the price change |
| Implemented on: | 1997-1-2 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 1553-1997 |
| English Name: | Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay |
| Chinese Name: | 硅和锗体内少数载流子寿命测定光电导衰减法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 77.040.01 Testing of metals in general |
| Source Content Issued by: | SBTS |
| Issued on: | 1997-06-03 |
| Implemented on: | 1997-1-2 |
| Status: | superseded |
| Superseded by: | GB/T 1553-2009 Test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconduetivity decay |
| Superseded on: | 2010-6-1 |
| Abolished on: | 2010-06-01 |
| Superseding: | GB 1553-1979 Measurement of monocrystalline silicon lifetime by D. C photoconductive decay methods GB 5257-1985 Germanium single crystals--Measurement of minority carrier lifetime--DC photo conductive decay method |
| Target Language: | English |
| File Format: | |
| Word Count: | 8000 words |
| Translation Price(USD): | 240.0 |
| Delivery: | via email in 1~3 business day |