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| Position: Chinese Standard in English/GB 5257-1985 |
| GB 5257-1985 Germanium single crystals--Measurement of minority carrier lifetime--DC photo conductive decay method (English Version) | |||
| Standard No.: | GB 5257-1985 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 2000 words | Translation Price(USD): | 180.0 remind me the price change |
| Implemented on: | 1986-7-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB 5257-1985 |
| English Name: | Germanium single crystals--Measurement of minority carrier lifetime--DC photo conductive decay method |
| Chinese Name: | 锗单晶少数载流子寿命直流光电导衰退测量方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Implemented on: | 1986-7-1 |
| Status: | superseded |
| Superseded by: | GB/T 1553-1997 Standard test methods for minority carrier lifetime in bulk germanium and silicon by measurement of photoconductivity decay |
| Superseded on: | 1997-1-2 |
| Target Language: | English |
| File Format: | |
| Word Count: | 2000 words |
| Translation Price(USD): | 180.0 |
| Delivery: | via email in 1~3 business day |