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| Position: Chinese Standard in English/GB 6801-1986 |
| GB 6801-1986 Reference methods of measurement for semiconductor devices (English Version) | |||
| Standard No.: | GB 6801-1986 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 6000 words | Translation Price(USD): | 180.0 remind me the price change |
| Implemented on: | 1987-7-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB 6801-1986 |
| English Name: | Reference methods of measurement for semiconductor devices |
| Chinese Name: | 半导体器件基准测试方法 |
| Chinese Classification: | L40 Semiconductor discrete devices in general |
| Professional Classification: | GB National Standard |
| Implemented on: | 1987-7-1 |
| Status: | superseded |
| Superseded by: | GB/T 4587-1994 Semiconductor discrete devices and integrated circuits--Part 7:Bipolar transistors |
| Target Language: | English |
| File Format: | |
| Word Count: | 6000 words |
| Translation Price(USD): | 180.0 |
| Delivery: | via email in 1~3 business day |