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| Position: Chinese Standard in English/GB/T 11685-1989 |
| GB/T 11685-1989 Test procedures for semiconductor X-ray energy spectrometers (English Version) | |||
| Standard No.: | GB/T 11685-1989 | Status: | abolished remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 7500 words | Translation Price(USD): | 570.0 remind me the price change |
| Implemented on: | 1990-5-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 11685-1989 |
| English Name: | Test procedures for semiconductor X-ray energy spectrometers |
| Chinese Name: | 半导体X射线能谱仪的测试方法 |
| Chinese Classification: | F80 Nuclear instrument and detector in general |
| Professional Classification: | GB National Standard |
| Issued on: | 1989-10-14 |
| Implemented on: | 1990-5-1 |
| Status: | abolished |
| Superseded by: | GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers |
| Superseded on: | 2004-1-1 |
| Abolished on: | 2004-01-01 |
| Target Language: | English |
| File Format: | |
| Word Count: | 7500 words |
| Translation Price(USD): | 570.0 |
| Delivery: | via email in 1~3 business day |