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| Position: Chinese Standard in English/GB/T 11685-2003 |
| GB/T 11685-2003 Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers (English Version) | |||
| Standard No.: | GB/T 11685-2003 | Status: | valid remind me the status change |
| Language: | English | File Format: | |
| Word Count: | 13000 words | Price(USD): | 390.00 remind me the price change |
| Implemented on: | 2004-1-1 | Delivery: | via email in 1~5 business day |
| Standard No.: | GB/T 11685-2003 |
| English Name: | Measurement procedures for semiconductor X-ray detector system and semiconductor X-ray energy spectrometers |
| Chinese Name: | 半导体X射线探测器系统和半导体X射线能谱仪的测量方法 |
| Chinese Classification: | F80 Nuclear instrument and detector in general |
| Professional Classification: | GB National Standard |
| ICS Classification: | 27.120.01 Nuclear energy in general |
| Issued by: | the Commission on Science, Technology and Industry for National Defense |
| Issued on: | 2003-07-07 |
| Implemented on: | 2004-1-1 |
| Status: | valid |
| Superseding: | GB/T 8992-1988 Test procedures for Si(Li) X-ray--Detector systems GB/T 11685-1989 Test procedures for semiconductor X-ray energy spectrometers |
| Language: | English |
| File Format: | |
| Word Count: | 13000 words |
| Price(USD): | 390.00 |
| Delivery: | via email in 1~5 business day |