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| Position: Chinese Standard in English/GB/T 13387-1992 |
| GB/T 13387-1992 Test method for measuring flat length on slices of electronic materials (English Version) | |||
| Standard No.: | GB/T 13387-1992 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 3000 words | Translation Price(USD): | 90.0 remind me the price change |
| Implemented on: | 1992-10-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 13387-1992 |
| English Name: | Test method for measuring flat length on slices of electronic materials |
| Chinese Name: | 电子材料晶片参考面长度测量方法 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| Source Content Issued by: | CSBTS |
| Issued on: | 1992-02-19 |
| Implemented on: | 1992-10-1 |
| Status: | superseded |
| Superseded by: | GB/T 13387-2009 Test method for measuring flat length wafers of silicon and other electronic materials |
| Superseded on: | 2010-6-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 3000 words |
| Translation Price(USD): | 90.0 |
| Delivery: | via email in 1~3 business day |