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| Position: Chinese Standard in English/GB/T 16596-1996 |
| GB/T 16596-1996 Specification for establishing a wafer coordinate system (English Version) | |||
| Standard No.: | GB/T 16596-1996 | Status: | superseded remind me the status change |
| Target Language: | English | File Format: | |
| Word Count: | 2500 words | Translation Price(USD): | 75.0 remind me the price change |
| Implemented on: | 1997-4-1 | Delivery: | via email in 1~3 business day |
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| Standard No.: | GB/T 16596-1996 |
| English Name: | Specification for establishing a wafer coordinate system |
| Chinese Name: | 确定晶片坐标系规范 |
| Chinese Classification: | H21 Metal physical property test method |
| Professional Classification: | GB National Standard |
| ICS Classification: | 29.045 Semiconducting materials |
| Source Content Issued by: | CSBTS |
| Issued on: | 1996-1-1 |
| Implemented on: | 1997-4-1 |
| Status: | superseded |
| Superseded by: | GB/T 16596-2019 |
| Superseded on: | 2020-2-1 |
| Target Language: | English |
| File Format: | |
| Word Count: | 2500 words |
| Translation Price(USD): | 75.0 |
| Delivery: | via email in 1~3 business day |